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Teradyne, Inc. TER Semiconductor Test — Goodwill Impaired Accumulated Impairment Loss
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Where this comes from
Reported directly by Teradyne, Inc. in its filing.
Tagged under the XBRL concept us-gaap:GoodwillImpairedAccumulatedImpairmentLoss.
The source filing: Teradyne, Inc.’s 10-Q, filed May 1, 2026.
- Filed
- May 1, 2026, 2:30 PM EDT
- Fiscal quarter
- Q1 FY2026
- Calendar quarter
- Q1 2026
- Accession
- 0001193125-26-201058
| Balance at December 31, 2025 | Robotics | Semiconductor Test | Product Test | Total |
|---|---|---|---|---|
| Goodwill | $416,401 | $263,598 | $603,586 | $1,283,585 |
| Accumulated impairment losses | — | (260,540) | (502,026) | (762,566) |
| Total Goodwill | 416,401 | 3,058 | 101,560 | 521,019 |
| Foreign currency translation adjustment | (6,834) | (10) | — | (6,844) |
| Balance at March 29, 2026 | ||||
| Goodwill | $409,567 | $263,588 | $603,586 | $1,276,741 |
| Accumulated impairment losses | — | (260,540) | (502,026) | (762,566) |
| Total Goodwill | $409,567 | $3,048 | $101,560 | $514,175 |
Item 1: Financial Statements
FAQ
- What is Teradyne, Inc.'s semiconductor test — goodwill impaired accumulated impairment loss?
- Teradyne, Inc. (TER) reported semiconductor test — goodwill impaired accumulated impairment loss of $260.54M in Q1 2026.
- How has Teradyne, Inc.'s semiconductor test — goodwill impaired accumulated impairment loss changed year-over-year?
- Teradyne, Inc.'s semiconductor test — goodwill impaired accumulated impairment loss decreased by 0.0% year-over-year, from $260.54M to $260.54M.
- What is the long-term trend for Teradyne, Inc.'s semiconductor test — goodwill impaired accumulated impairment loss?
- Over 4 years (2021 to 2025), Teradyne, Inc.'s semiconductor test — goodwill impaired accumulated impairment loss has grown at a 0.0% compound annual growth rate (CAGR), from $1.04B to $1.04B.
- What does semiconductor test — goodwill impaired accumulated impairment loss mean?
- This metric tracks the cumulative amount of impairment losses recognized against the goodwill associated with the semiconductor test segment. It reflects management's assessment that the carrying value of the segment's goodwill exceeds its recoverable fair value.
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